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CAMECA, SAS
29 Quai des Gresillons
Gennevilliers Cedex,
92622
France
Phone: 33 1 43 34 62 00
Website: http://www.cameca.com
Email: cameca.info@ametek.com
Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA) and Atom Probe Tomography(APT).
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ORTEC
Advanced Measurement Technology, Inc
801 South Illinois Avenue
Oak Ridge,
Tennessee
37831-0895
United States
Phone: 865.482.4411
Phone 2: 800.251.9750
Fax: 865.483.0396
Website: http://www.ortec-online.com
Email: ortec.info@ametek.com
High resolution Germanium detectors, silicon detectors, pulse-processing electronics, and software. Spectrometry instruments and systems for measuring energy and time distributions of optical photons, X-rays, gamma rays, charged particles, and neutrons. Advanced data analysis software for the identification and quantification of nuclear materials based on radiation signatures.
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