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CAMECA, SAS
29 Quai des Gresillons
Gennevilliers Cedex,
92622
France
Phone: 33 1 43 34 62 00
Website: http://www.cameca.com
Email: cameca.info@ametek.com
Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA) and Atom Probe Tomography(APT).
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EDAX
91 McKee Drive
Mahwah,
New Jersey
07432
United States
Phone: 201-529-4880
Fax: 201-529-3156
Website: http://www.edax.com
Email: edax.sales@ametek.com
EDS and WDS X-ray microanalysis, electron backscatter diffraction (EBSD), crystallographic analysis via TEM electron diffraction and Micro-EDXRF.
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Precitech, Inc.
44 Blackbrook Road
Keene,
New Hampshire
03431
United States
Phone: 603-357-2511
Fax: 603-358-6174
Website: http://www.precitech.com
Ultra precision diamond machining systems for single point diamond turning, precision grinding and diamond milling of spherical, aspheric and non-axis symmetric (freeform) optics, optical molds and precision mechanical components, metrology systems for form measurement and associated OEM components.
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Taylor Hobson - Main Office In England
PO Box 36
2 New Star Road
Leicester, England,
LE4 9JQ
United Kingdom
Phone: 44 116 276 3771
Fax: 44 116 246 0579
Website: http://www.taylor-hobson.com
Email: taylor-hobson.sales@ametek.com
Contact and non-contact instruments for the measurement of surface finish, form and contour of components in both 2D and 3D, roundness, concentricity, runout, cylindricity, coaxiality and other parameters. Electro-optical instruments for alignment, flatness, angle, squareness, parallelism, straightness and twist measurement.
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